| 摘要 |
PROBLEM TO BE SOLVED: To provide a material texture observing device by which a replica need not be taken from a diagnosis object part and metallic texture is easily observed in a short time on the site. SOLUTION: The material texture observing device is equipped with: a semiconductor laser provided in a microscope main body 15 having hermetically sealed structure and emitting a laser beam; an optical path provided in the microscope main body and bending and guiding the laser beam emitted from the semiconductor laser; an objective attached to the edge part of the optical path and capable of moving in an up-and-down direction; an image sensor provided in the optical path and receiving the reflected laser beam; a first base which supports the microscope main body 15 tiltably in a right-and-left direction; a second base to which the first base is attached; and a third base which abuts on the lower surface of the second base. The second base and the third base can move in two orthogonal axial directions. The observing device is equipped with: a moving mechanism for moving the objective, the second base and the third base; and a tilting mechanism for tilting the microscope main body 15, and further has fixed tool devices 44, 45 and 46 to be fixed on an object to be observed. COPYRIGHT: (C)2007,JPO&INPIT
|
