<p>A probe, comprising a plate-like main body part having a base end fitted to a support base plate and a tip on the opposite side of the base end and manufactured of a tough material and a needle tip part disposed at the tip of the main body part and having a needle tip brought into contact with the electrode of a tested body. The main body part comprises conductive materials extending from the base end to the tip and at least partly buried in the tough material. The tough material comprises a toughness higher than that of the conductive materials, and the conductive materials comprise a conductivity higher than that of the tough material. Thus, the disturbance of signals provided through the probe can be reduced without impairing the elastic deformation of the probe.</p>
