| 摘要 |
PROBLEM TO BE SOLVED: To solve the problems wherein measurement requires a long time, and a large circuit scale is required, because data as many as the number of samples are stored in a memory, and then the data are analyzed and jitter is operated. SOLUTION: An approximate cycle of a signal for measuring jitter is given, and a fraction pulse X having the pulse width of the time difference from a changing point of the signal to a changing point of a reference clock and a fraction pulse Y having the pulse width of the time difference between a changing point of a reference pulse and a changing point of the signal for measuring jitter after elapse of a prescribed time determined from the approximate cycle after finish of the fraction pulse X are generated, and a change width of an added value of each pulse width of the fraction pulses X, Y is determined. Hereby, jitter can be measured highly accurately at high speed with a simple circuit. COPYRIGHT: (C)2007,JPO&INPIT
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