MATERIAL DATA ACQUIRING METHOD AND MATERIAL DATA PROFILER USING EVANESCENT LIGHT, AND METHOD AND SYSTEM FOR DETERMINATION OF BASE SEQUENCE

摘要

PROBLEM TO BE SOLVED: To provide positional information and displacement information of material utilizing evanescent light illumination technology. SOLUTION: In this method, first a detected material T is fixed on interface S which may generate evanescent light PEby utilizing such a nature that intensity of the evanescent light PEwill exponentially and rapidly attenuate with increase in distance Z from the interface S, while acquiring positional information Z and displacement information (Δz) of the above detected material T based on the fluorescence intensity I derived from the above detected material T excited by the above evanescent light PE. By using these positional information Z and displacement information (Δz), structure or variation of the material, its base sequence, presence or status of any interaction between materials, etc. can be acquired. COPYRIGHT: (C)2007,JPO&INPIT