发明名称 Apparatus for and method of measuring clock skew
摘要 Timing jitter sequences Deltaphi<SUP>j</SUP>[n] and Deltaphi<SUP>k</SUP>[n] of respective clock signals under measurement x<SUB>j</SUB>(t) and x<SUB>k</SUB>(t) are estimated, and a timing difference sequence between those timing jitter sequences is calculated. In addition, initial phase angles phi<SUB>0</SUB><SUP>j </SUP>and phi<SUB>0</SUB><SUP>k </SUP>of linear instantaneous phases of the x<SUB>j</SUB>(t) and x<SUB>k</SUB>(t) are estimated, respectively. A sum of a difference between those initial angles and the timing difference sequence is calculated to obtain a clock skew sequence between the x<SUB>j</SUB>(t) and x<SUB>k</SUB>(t).
申请公布号 US2007036256(A1) 申请公布日期 2007.02.15
申请号 US20020585526 申请日期 2002.03.19
申请人 ADVANTEST CORPORATION 发明人 YAMAGUCHI TAKAHIRO;ISHIDA MASAHIRO;SOMA MANI
分类号 G04F10/04;H04L7/00;G01R31/317;G01R31/319;G01R31/3193;H04L1/20 主分类号 G04F10/04
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