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发明名称
Integrated Circuit having fine-pitch Pads, and Probe card and method for testing the
摘要
申请公布号
KR20070017788(A)
申请公布日期
2007.02.13
申请号
KR20050072375
申请日期
2005.08.08
申请人
发明人
分类号
H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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