发明名称 APPARATUS FOR TREATING PLASMA AND METHOD FOR CLEANING THE SAME
摘要 A plasma processing apparatus and its cleaning method are provided to remove a deposited material formed on an inner wall of an inner chamber at a uniform etching speed by directly applying high frequency power to the inner chamber. An external chamber(120) accommodates an inner chamber(110). The external chamber has a gas supplying member(140) which supplies a process gas or a cleaning gas to the inner chamber. An inner electrode(130) is located in the inner chamber. A plasma generating member(160) independently applies power to the inner electrode and the inner chamber. The plasma generating member includes a first high frequency generator(161) and a second high frequency generator(165). The first high frequency generator applies high frequency power to the inner electrode. The second high frequency generator applies high frequency power to the inner chamber.
申请公布号 KR100684910(B1) 申请公布日期 2007.02.13
申请号 KR20060010098 申请日期 2006.02.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, WEON HONG;WON, SEOK JUN;KWON, DAE JIN;SONG, MIN WOO;KIM, JU YOUN;PARK, JUNG MIN
分类号 H01L21/205 主分类号 H01L21/205
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