发明名称 Epitaxy layer and method of forming the same
摘要 A method of forming an epitaxial layer of uniform thickness is provided to improve surface flatness. A substrate is first provided and a Si base layer is then formed on the substrate by epitaxy. A Si-Ge layer containing 5 to 10% germanium is formed on the Si base layer by epitaxy to normalize the overall thickness of the Si base layer and the Si-Ge layer containing 5 to 10% germanium.
申请公布号 US7175709(B2) 申请公布日期 2007.02.13
申请号 US20040847099 申请日期 2004.05.17
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 TSAI PANG-YEN;YAO LIANG-GI;LIN CHUN-CHIEH;LEE WEN-CHIN;CHEN SHIH-CHANG
分类号 C30B25/04;C30B23/00;C30B25/00;C30B28/12;C30B28/14 主分类号 C30B25/04
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