发明名称 |
FINE PARTICLE MEASURING METHOD AND FINE PARTICLE MEASURING INSTRUMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a fine particle measuring method which enables the measurement of fine particles with high measuring precision and high detection precision, and a fine particle measuring instrument. SOLUTION: Fine particles to be measured are labelled with a fluorescent dye and scattered light is measured in a fluorescent fine particle measuring part 3 to measure fine particles. The measuring sample containing the labelled fine particles is circulated to repeatedly perform measurement. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007033354(A) |
申请公布日期 |
2007.02.08 |
申请号 |
JP20050220005 |
申请日期 |
2005.07.29 |
申请人 |
FUJI ELECTRIC SYSTEMS CO LTD |
发明人 |
TANAKA YOSHIHARU;TAGUCHI KAZUYUKI |
分类号 |
G01N15/06;C12M1/34;C12Q1/06;G01N21/64 |
主分类号 |
G01N15/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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