发明名称 FINE PARTICLE MEASURING METHOD AND FINE PARTICLE MEASURING INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To provide a fine particle measuring method which enables the measurement of fine particles with high measuring precision and high detection precision, and a fine particle measuring instrument. SOLUTION: Fine particles to be measured are labelled with a fluorescent dye and scattered light is measured in a fluorescent fine particle measuring part 3 to measure fine particles. The measuring sample containing the labelled fine particles is circulated to repeatedly perform measurement. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007033354(A) 申请公布日期 2007.02.08
申请号 JP20050220005 申请日期 2005.07.29
申请人 FUJI ELECTRIC SYSTEMS CO LTD 发明人 TANAKA YOSHIHARU;TAGUCHI KAZUYUKI
分类号 G01N15/06;C12M1/34;C12Q1/06;G01N21/64 主分类号 G01N15/06
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