发明名称 Methods of forming CoSi2, methods of forming field effect transistors, and methods of forming conductive contacts
摘要 The invention included to methods of forming CoSi<SUB>2</SUB>, methods of forming field effect transistors, and methods of forming conductive contacts. In one implementation, a method of forming CoSi<SUB>2 </SUB>includes forming a substantially amorphous layer comprising MSi<SUB>x </SUB>over a silicon-containing substrate, where "M" comprises at least some metal other than cobalt. A layer comprising cobalt is deposited over the substantially amorphous MSi<SUB>x</SUB>-comprising layer. The substrate is annealed effective to diffuse cobalt of the cobalt-comprising layer through the substantially amorphous MSi<SUB>x</SUB>-comprising layer and combine with silicon of the silicon-containing substrate to form CoSi<SUB>2 </SUB>beneath the substantially amorphous MSi<SUB>x</SUB>-comprising layer. Other aspects and implementations are contemplated.
申请公布号 US2007032071(A1) 申请公布日期 2007.02.08
申请号 US20050195174 申请日期 2005.08.02
申请人 MICRON TECHNOLOGY, INC. 发明人 HU YONGJUN J.
分类号 H01L21/4763 主分类号 H01L21/4763
代理机构 代理人
主权项
地址