发明名称 PROBE, PROBE UNIT, AND CIRCUIT BOARD INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a probe whose manufacturing cost can be reduced. SOLUTION: A probe is such constituted that one of leading edges 21a and 21b can come into contact with a target of inspection, while one of the leading edges 21a and 21b is inserted into an insertion hole 42a of a leading edge side holding plate 42 provided at the leading edge of a holder 12 and the other of the leading edges 21a and 21b is also inserted into an insertion hole 43a of a tail end side holding plate 43 provided at a tail end of the holder 12. The leading edges 21a and 21b are formed in the same shape. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007033363(A) 申请公布日期 2007.02.08
申请号 JP20050220091 申请日期 2005.07.29
申请人 HIOKI EE CORP 发明人 HORI SEIICHI
分类号 G01R1/067;G01R1/073;G01R31/28 主分类号 G01R1/067
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