发明名称 METHOD AND APPARATUS FOR MEASURING HIGH-FREQUENCY ELECTRICAL CHARACTERISTICS OF ELECTRONIC DEVICE, AND METHOD FOR CALIBRATING APPARATUS FOR MEASURING HIGH-FREQUENCY ELECTRICAL CHARACTERISTICS
摘要 A signal conductor whose first end is an open end, and a ground conductor are connected to associated measurement ports of a network analyzer. A short standard is connected between the signal conductor and the ground conductor at least three points in the longitudinal direction of the signal conductor, and electrical characteristics are measured, thereby calculating error factors of a measurement system including a transmission line. An electronic device to be measured is connected between the signal conductor and the ground conductor, and an electrical characteristic is measured. The error factors of the measurement system are removed from the measured value of the electronic device to be measured, thereby obtaining a true value of the electrical characteristic of the electronic device. Accordingly, a highly accurate high-frequency electrical characteristic measuring method, using a reflection method, that is not affected by connection variations can be implemented.
申请公布号 US2007029990(A1) 申请公布日期 2007.02.08
申请号 US20060537111 申请日期 2006.09.29
申请人 MURATA MANUFACTURING CO., LTD. 发明人 KAMITANI GAKU
分类号 G01R23/16 主分类号 G01R23/16
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