发明名称 METHOD FOR DETERMINING PRESENCE OF STRUCTURAL DEFECT IN LAMINATED CAPACITOR, METHOD FOR EVALUATING DEFLECTION LIMIT, AND METHOD FOR INFERRING STRUCTURAL DEFECT LOCATION
摘要 PROBLEM TO BE SOLVED: To provide a method for high-reliability determination of the presence of a structural defect, concerning a laminated capacitor provided with an internal electrode having a plurality of drawers. SOLUTION: A plurality of external terminal electrodes 16-19 are respectively electrically connected to the plurality of drawers which are formed in the internal electrode. DC current is made to flow, from the external terminal electrodes 16, 17 of one group to the external terminal electrodes 18, 19 of the other group. Accordingly, the DC resistance value or the DC current value is measured, and the existence of the structural defects is determined based on the value. The deflection limit of the laminated capacitor 1 is also evaluated based on the same connection state. When the connection state is changed, the location where the structural defects are occurring can be inferred. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007035943(A) 申请公布日期 2007.02.08
申请号 JP20050217375 申请日期 2005.07.27
申请人 MURATA MFG CO LTD 发明人 TAKASHIMA HIROKAZU;KAMIOKA HIROSHI;TAKAGI GIICHI
分类号 H01G13/00 主分类号 H01G13/00
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