| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for determining a trace element in a sapphire substrate by solubilizing a sapphire substrate sample hard to be solubilized, having characteristics such as high strength, high rigidity, high abrasion resistance, high heat resistance and high corrosion resistance, while removing introduction of impurities and contamination as much as possible. SOLUTION: In this determination method of a trace element in sapphire, the sapphire substrate sample is decomposed by an acid decomposition method or by an alkali fusion method, and the trace element in acquired solution is measured by flow injection introduction-ICP/mass spectrometry. COPYRIGHT: (C)2007,JPO&INPIT
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