| 摘要 |
A measuring device for immunochromatography test piece comprising an irradiation optical system for irradiating measurement light to an immunochromatography test piece, and a detection optical system for detecting reflected light from the immunochromatography test piece under irradiation with the measurement light. The irradiation optical system comprises a semiconductor light emitting element and is placed so that light from the semiconductor light emitting element is irradiated as the measurement light from a direction substantially normal to the immunochromatography test piece. The detection optical system comprises a semiconductor photodetector provided at an obliquely upward position in a direction substantially parallel to a colored line formed on the immunochromatography test piece, with respect to an irradiation position of the measurement light on the immunochromatography test piece, and is placed so that the semiconductor photodetector detects obliquely upward reflected light in the direction substantially parallel to the colored line.
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