| 摘要 |
A testing system performs simultaneous automated at-speed testing of a plurality of devices that generate serial data signals having gigabit per second baud rates coupled to a DIB and device connectors on the DIB. The testing system includes a rider board including rider board connectors coupled to corresponding ones of the device connectors, an individual set of multiplexers coupled to each one of said rider board connectors, a controller coupled to each of said set of multiplexers, and an internal testing system including a tester and testing system multiplexers, said tester being coupled to each of said set of multiplexers via said testing system multiplexers.
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