发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE |
摘要 |
A semiconductor IC device is provided to improve the resistance against a reflow crack by increasing a bonding area between a semiconductor chip and a resin using a through hole of a chip mounting portion. A semiconductor IC device includes a semiconductor chip(2) with a semiconductor IC and bonding pads, a chip mounting portion for mounting the chip, a suspension lead portion(4) for supporting the chip mounting portion, a plurality of inner leads around the chip, a plurality of outer leads prolonged from the inner leads, a plurality of bonding wires for connecting electrically the bonding pads of the chip with front portions of the inner leads, and a resin body for encapsulating selectively the resultant structure. The size of the chip mounting portion is smaller than that of the chip. The chip mounting portion has a through hole(31). |
申请公布号 |
KR100680668(B1) |
申请公布日期 |
2007.02.02 |
申请号 |
KR20060099274 |
申请日期 |
2006.10.12 |
申请人 |
HITACHI, LTD.;HITACHI ULSI SYSTEMS CO., LTD. |
发明人 |
KAJIHARA YUJIROU;SUZUKI KAZUNARI;TSUBOSAKI KUNIHIRO;SUZUKI HIROMICHI;MIYAKI YOSHINORI;NAITOH TAKAHIRO;KAWAI SUEO |
分类号 |
H01L23/495;H01L23/50;H01L21/48;H01L21/52;H01L21/60 |
主分类号 |
H01L23/495 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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