| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a technology capable of detecting the temperature of a semiconductor device with high accuracy. <P>SOLUTION: A temperature detection circuit 14 for detecting the temperature of the semiconductor device comprises a short-period oscillator 15 for generating a clock signal CLK1 having positive-temperature characteristic related to frequency, a short-period oscillator 16 for generating a clock signal CLK2 having a negative temperature characteristic related to frequency, and a temperature signal generating section 17 for generating temperature signal TEMP that varies according to the temperature of the semiconductor device, based on the clock signals CLK1 and CLK2. <P>COPYRIGHT: (C)2007,JPO&INPIT</p> |
