发明名称 |
Verfahren zur Bestimmung der Lage einer Schicht in einem Untersuchungsgebiet, in welcher Schicht eine Schichtbildaufnahme erfolgen soll |
摘要 |
Method for determining the position of at least a layer in an examination area, in which layer a section image of the examination area is to be recorded using an examination apparatus. Accordingly a 3D image data set of the examination area is recorded. This is then registered with a previously recorded 3D reference image set. Following this the layer of interest is determined using at least a reference layer defined in the 3D reference image set. |
申请公布号 |
DE102004003381(B4) |
申请公布日期 |
2007.02.01 |
申请号 |
DE20041003381 |
申请日期 |
2004.01.22 |
申请人 |
SIEMENS AG |
发明人 |
JANSEN, ISABELLE;KUTH, RAINER |
分类号 |
A61B19/00;A61B5/055;A61B6/00;A61B6/03;G01N23/04;G01N23/06;G06T7/00;G06T11/00;G06T17/40 |
主分类号 |
A61B19/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|