发明名称 Verfahren zur Bestimmung der Lage einer Schicht in einem Untersuchungsgebiet, in welcher Schicht eine Schichtbildaufnahme erfolgen soll
摘要 Method for determining the position of at least a layer in an examination area, in which layer a section image of the examination area is to be recorded using an examination apparatus. Accordingly a 3D image data set of the examination area is recorded. This is then registered with a previously recorded 3D reference image set. Following this the layer of interest is determined using at least a reference layer defined in the 3D reference image set.
申请公布号 DE102004003381(B4) 申请公布日期 2007.02.01
申请号 DE20041003381 申请日期 2004.01.22
申请人 SIEMENS AG 发明人 JANSEN, ISABELLE;KUTH, RAINER
分类号 A61B19/00;A61B5/055;A61B6/00;A61B6/03;G01N23/04;G01N23/06;G06T7/00;G06T11/00;G06T17/40 主分类号 A61B19/00
代理机构 代理人
主权项
地址