发明名称 Semiconductor devices and methods for forming the same including contacting gate to source
摘要 Semiconductors having electrically coupled gate and impurity doped regions and methods for fabricating the same are provided. A method in accordance with an embodiment of the invention comprises forming a gate electrode overlying a substrate and an impurity doped region within the substrate. A first spacer is formed on a first side and a second spacer on a second side of the gate electrode. An ion is implanted into the first spacer with an angle greater than zero from an axis perpendicular to the surface of the substrate. The first spacer is etched to remove a portion thereof and a silicon film is deposited overlying a remainder of the first spacer, the impurity doped region and the second spacer. The silicon film is etched, forming a silicon spacer, and a silicide-forming metal is deposited to form a silicide contact that electrically couples the gate electrode and the impurity doped region.
申请公布号 US7169676(B1) 申请公布日期 2007.01.30
申请号 US20050135711 申请日期 2005.05.23
申请人 ADVANCED MICRO DEVICES, INC. 发明人 ZHONG HUICAI
分类号 H01L21/336;H01L21/425 主分类号 H01L21/336
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