发明名称 |
METHOD FOR FORMING BIT LINE OF SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for forming a bit line of a semiconductor device preventing an increase in bit line resistance due to a barrier metal, and an increase in capacitance. SOLUTION: The method for forming a bit line of a semiconductor device includes steps of: forming a contact hole after forming an interlayer insulating film on the top of a semiconductor substrate on which a predetermined structure is formed; forming a first conductive layer inside the contact hole; forming a barrier metal layer and embedding the contact hole therein after etching the first conductive layer to a predetermined depth; forming a second interlayer insulating film on the entire structure; and embedding a second conductive layer after etching the second interlayer insulating film so that the barrier metal layer is exposed. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007019501(A) |
申请公布日期 |
2007.01.25 |
申请号 |
JP20060181009 |
申请日期 |
2006.06.30 |
申请人 |
HYNIX SEMICONDUCTOR INC |
发明人 |
AHN JUNG RYUL;LEE SEOK KIU |
分类号 |
H01L21/768;H01L21/28;H01L21/8247;H01L23/522;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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