发明名称 METHOD FOR FORMING BIT LINE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for forming a bit line of a semiconductor device preventing an increase in bit line resistance due to a barrier metal, and an increase in capacitance. SOLUTION: The method for forming a bit line of a semiconductor device includes steps of: forming a contact hole after forming an interlayer insulating film on the top of a semiconductor substrate on which a predetermined structure is formed; forming a first conductive layer inside the contact hole; forming a barrier metal layer and embedding the contact hole therein after etching the first conductive layer to a predetermined depth; forming a second interlayer insulating film on the entire structure; and embedding a second conductive layer after etching the second interlayer insulating film so that the barrier metal layer is exposed. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007019501(A) 申请公布日期 2007.01.25
申请号 JP20060181009 申请日期 2006.06.30
申请人 HYNIX SEMICONDUCTOR INC 发明人 AHN JUNG RYUL;LEE SEOK KIU
分类号 H01L21/768;H01L21/28;H01L21/8247;H01L23/522;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/768
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