发明名称 METHOD AND MEASURING MACHINE FOR FORMING FINE TEST PIECE WITH CONDITION CHANGE TO NANO DOMAIN AND MEASURING PROPERTY TO NANO DOMAIN AT ANY TIME WITH AUTOMATIC OPTIMUM CONTROL
摘要 PROBLEM TO BE SOLVED: To provide a measuring machine for measuring a nano property in a nano domain inexpensively with automatic control, automatic adjustment and high accuracy, while changing a condition, by using an easily-handleable test piece having a simple shape. SOLUTION: A fine test piece of all materials such as a metal, a polymer or ceramics to be measured is fixed to a device, and the nano property is measured by the device for measuring the nano property in the nano domain of the test piece, while adjusting automatically and accurately a three-dimensional display of a change caused by a tensile force or the like corresponding to a change of the temperature or the shape. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007017416(A) 申请公布日期 2007.01.25
申请号 JP20050223382 申请日期 2005.07.05
申请人 NANO FUTURE:KK 发明人 NEMOTO TETSUYA;MATSUURA HIROYUKI;NAKANO MASAHIRO;ASAHIOKA KATSUYOSHI;YAMAZAKI TAKANORI
分类号 G01N3/08;G01N1/28 主分类号 G01N3/08
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