发明名称 NORMAL PRESSURE CVD METHOD AND ITS DEVICE
摘要 PROBLEM TO BE SOLVED: To allow a film forming process with a wafer of small size using a reactor of large size, at a high throughput, efficiently and evenly. SOLUTION: A plurality of wafers W of small size are sucked/held by a holding means 70 of a CVD device 1 for large size. In this held state, the plurality of the wafers W are film-formed at once in a reactor 80 for large size. The wafers W are temporarily taken out of the reactor 80 in the middle of film forming, and after orientation of the wafers W are changed by an orientation changing means 40, they are returned to the reactor 80 for resuming the film forming process. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007019068(A) 申请公布日期 2007.01.25
申请号 JP20050195967 申请日期 2005.07.05
申请人 SEKISUI CHEM CO LTD 发明人 ITO TAKUMI
分类号 H01L21/31;C23C16/458 主分类号 H01L21/31
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