发明名称 PROBE SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a simply-configured probe system which enables reliable alignment of the probe with any test subject. SOLUTION: This probe system 103 comprises a probe body 107 equipped with a contact pin, and a retaining means equipped with both a flange member 111 provided on rim of the probe body and a probe holder 108 which slidably-accommodates the flange member within a specific range centered on its steady-state position, a down slope 156 for returning the slid flange member 111 to its steady-state position is formed inside the probe holder 108. The probe holder 108 is provided with a guide plate 153 which slides the probe body 107 together with the flange member 111 held in a vertical status. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007017448(A) 申请公布日期 2007.01.25
申请号 JP20060228844 申请日期 2006.08.25
申请人 TDK CORP 发明人 KASUYA TAKAYUKI
分类号 G01R31/28;G01R1/06;G01R1/067 主分类号 G01R31/28
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