发明名称 Method and apparatus for determining electrical properties of structures
摘要 A method and apparatus for determining an electrical property of a structure. The method involves creating a model of an electrical property of a structure and measuring the electrical property of the structure between at least two of a plurality of locations. The method also involves determining the electrical property of at least a portion of the structure based on the model and the measurement of the electrical property between the at least two of the plurality of locations.
申请公布号 US7167009(B2) 申请公布日期 2007.01.23
申请号 US20040949944 申请日期 2004.09.24
申请人 MIDE TECHNOLOGY CORPORATION 发明人 VAN SCHOOR MARTHINUS;CUTLER ANDREW M.;MULLER GERT J.;LENGYEL ATTILA;RADIGHIERI BROOKS
分类号 G01R27/08;G01L1/20;G01L5/04 主分类号 G01R27/08
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