发明名称 |
Method and apparatus for determining electrical properties of structures |
摘要 |
A method and apparatus for determining an electrical property of a structure. The method involves creating a model of an electrical property of a structure and measuring the electrical property of the structure between at least two of a plurality of locations. The method also involves determining the electrical property of at least a portion of the structure based on the model and the measurement of the electrical property between the at least two of the plurality of locations.
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申请公布号 |
US7167009(B2) |
申请公布日期 |
2007.01.23 |
申请号 |
US20040949944 |
申请日期 |
2004.09.24 |
申请人 |
MIDE TECHNOLOGY CORPORATION |
发明人 |
VAN SCHOOR MARTHINUS;CUTLER ANDREW M.;MULLER GERT J.;LENGYEL ATTILA;RADIGHIERI BROOKS |
分类号 |
G01R27/08;G01L1/20;G01L5/04 |
主分类号 |
G01R27/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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