| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a sample for infrared absorption spectrum analysis capable of sharply obtaining an infrared absorption peak when a fine sample is subjected to infrared absorption spectrum analysis and reducing the concerns of losing the infrared absorption peak. <P>SOLUTION: A sample 1 containing an analyzing target is arranged in the recess 5 with a depth of 0.8μm or above formed to the surface of a window material 2 not having an absorption peak becoming an obstacle in the wavelength range used in infrared absorption spectrum analysis (a). The pressing surface of a press member 6, which has the pressing surface comprising a lower layer part 7 constituted of a material lower than the window material 2 in surface energy, is brought into contact with the surface of the window material 2 under pressure to roll the sample 1 into the thickness corresponding to the depth of the recess 5 so that the surface of the sample 1 is present in the plane common to the surface of the window material 2 in the periphery of the recess 5 (b and c). Thereafter, the press member 6 is removed to obtain the rolled sample 1 in the form arranged in the recess 5 of the window material 2 (d). <P>COPYRIGHT: (C)2007,JPO&INPIT</p> |
