发明名称 |
FIN FET CMOS, METHOD OF MANUFACTURING THE SAME, AND MEMORY DEVICE COMPRISING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a Fin FET CMOS, a method of manufacturing the same, and a memory device comprising the same. <P>SOLUTION: The Fin FET CMOS comprises an n-type transistor provided on a substrate, an interlayer insulating layer stacked on the n-type transistor, and a p-type transistor provided on the interlayer insulating layer. The n-type and p-type transistors have a common gate insulating film and a common fin gate. <P>COPYRIGHT: (C)2007,JPO&INPIT |
申请公布号 |
JP2007013156(A) |
申请公布日期 |
2007.01.18 |
申请号 |
JP20060177271 |
申请日期 |
2006.06.27 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
HYUN JAE-WOONG;PARK YOON-DONG;KIM WON-JOO;BYUN SUNG-JAE |
分类号 |
H01L21/8244;H01L21/8238;H01L27/092;H01L27/11;H01L29/41 |
主分类号 |
H01L21/8244 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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