发明名称 SURFACE PLASMON RESONANCE ELEMENT AND APPARATUS FOR MEASURING SURFACE PLASMON RESONANCE
摘要 PROBLEM TO BE SOLVED: To provide a surface plasmon resonance element and a surface plasmon resonance measuring apparatus capable of effectively excluding the effects of noise and improving sensitivity. SOLUTION: By forming a reflecting surface 7 having a high transmissivity to incident electromagnetic waves which generate surface plasmon resonance and having a required transmissivity to a first major face of a transparent substrate 6 having first and second major surfaces opposed to each other, repetition effects of reflection and interference are effectively generated. The quantity of reflected light or reflectivity from a surface element is measured when the angle of incidence of electromagnetic waves to the surface plasmon resonance element is changed in this way. An oscillatory waveform due to amplitude changes associated with the above-mentioned interference effects of electromagnetic waves is acquired. Surface plasmon resonance is detected by processing signals of the oscillatory waveform to avoid the effects of noise. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007010578(A) 申请公布日期 2007.01.18
申请号 JP20050194219 申请日期 2005.07.01
申请人 SONY CORP 发明人 YAMADA MASAHIRO;AOKI SUNAO;MIURA TAKAHIRO
分类号 G01N21/27 主分类号 G01N21/27
代理机构 代理人
主权项
地址