发明名称 PROGRAM CONTROL CIRCUIT AND METHOD FOR FLASH MEMORY DEVICE HAVING MULTI-LEVEL CELL
摘要 <p><P>PROBLEM TO BE SOLVED: To prevent overprogramming and to shorten programming time by selectively adjusting the time for supplying a word line bias voltage based on program cycles being in progress in a program control circuit and method for multi-level cells. <P>SOLUTION: The program control circuit of the flash memory device is configured by including a voltage selection circuit for outputting a program bias voltage generated by a word line voltage generator to an X-decoder connected to a word line between one of first to third clock signals and one of first to third set time or a verify bias voltage generated by the word line voltage generator to the X-decoder during fourth set time in response to one of first to third cycle control signals. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007012237(A) 申请公布日期 2007.01.18
申请号 JP20050358681 申请日期 2005.12.13
申请人 HYNIX SEMICONDUCTOR INC 发明人 LEE HEE YOUL;CHANG HEE HYUN
分类号 G11C16/02 主分类号 G11C16/02
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