发明名称 |
COMPOSITION FOR FORMING ETCHING STOPPER LAYER |
摘要 |
PROBLEM TO BE SOLVED: To provide a composition for forming an etching stopper layer reconciled in both dry etching selectivity and low permittivity, and to provide a method of manufacturing a semiconductor device using the composition. SOLUTION: In the composition for forming the etching stopper layer containing a silicon-containing polymer, the silicon-containing polymer contained in the composition contains a disilylbenzene structure. In the method of manufacturing the semiconductor device, the etching stopper layer is formed by using the composition. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007012639(A) |
申请公布日期 |
2007.01.18 |
申请号 |
JP20030352219 |
申请日期 |
2003.10.10 |
申请人 |
AZ ELECTRONIC MATERIALS KK |
发明人 |
TASHIRO YUJI;AOKI HIROYUKI;ISHIKAWA TOMONORI |
分类号 |
H01L21/312;C08G77/52;C08G77/54;C09D183/14;H01L21/3065;H01L21/311;H01L21/768 |
主分类号 |
H01L21/312 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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