发明名称 COMPOSITION FOR FORMING ETCHING STOPPER LAYER
摘要 PROBLEM TO BE SOLVED: To provide a composition for forming an etching stopper layer reconciled in both dry etching selectivity and low permittivity, and to provide a method of manufacturing a semiconductor device using the composition. SOLUTION: In the composition for forming the etching stopper layer containing a silicon-containing polymer, the silicon-containing polymer contained in the composition contains a disilylbenzene structure. In the method of manufacturing the semiconductor device, the etching stopper layer is formed by using the composition. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007012639(A) 申请公布日期 2007.01.18
申请号 JP20030352219 申请日期 2003.10.10
申请人 AZ ELECTRONIC MATERIALS KK 发明人 TASHIRO YUJI;AOKI HIROYUKI;ISHIKAWA TOMONORI
分类号 H01L21/312;C08G77/52;C08G77/54;C09D183/14;H01L21/3065;H01L21/311;H01L21/768 主分类号 H01L21/312
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