发明名称 SEMICONDUCTOR STORAGE DEVICE AND METHOD OF MANUFACTURING SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor storage device and method of manufacturing the same capable of improving the characteristics of a semiconductor storage device. <P>SOLUTION: The method of manufacturing a semiconductor storage device 100 includes (a) a step for forming a high melting point metal layer 22 on a base 10, (b) a step for forming an antioxidant film 24 on the upper of the high melting point metal layer, (c) a step for forming an insulating layer 62 above the antioxidant film, and (d) a step for forming a storage cell 50 above the insulating layer. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007012812(A) 申请公布日期 2007.01.18
申请号 JP20050190447 申请日期 2005.06.29
申请人 SEIKO EPSON CORP 发明人 KAMIYA TOSHIYUKI;MATSUMOTO AKITO
分类号 H01L21/8246;H01L21/768;H01L21/8242;H01L27/105;H01L27/108 主分类号 H01L21/8246
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