发明名称 COMPOSITIONS AND METHODS FOR DRYING PATTERNED WAFERS DURING MANUFACTURE OF INTEGRATION CIRCUITRY PRODUCTS
摘要 Drying of patterned wafers is achieved in a manner effecting removal of water from the patterned wafers without collapse or deterioration of the pattern structures thereof. The drying is carried out in one aspect of the invention with a composition containing supercritical fluid, and at least one water-reactive agent that chemically reacts with water to form reaction product(s) more soluble in the supercritical fluid than water. Various methodologies are described for use of supercritical fluids to dry patterned wafers, which avoid the (low water solubility) deficiency of supercritical fluids such as supercritical CO2. ® KIPO & WIPO 2007
申请公布号 KR20070008703(A) 申请公布日期 2007.01.17
申请号 KR20067024452 申请日期 2006.11.22
申请人 ADVANCED TECHNOLOGY MATERIALS INC. 发明人 XU CHONGYING;KORZENSKI MICHAEL;BAUM THOMAS H.;BOROVIK ALEXANDER;GHENCIU ELIODOR G.
分类号 H01L21/304 主分类号 H01L21/304
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