发明名称 Plasma Treatment at Film Layer to Reduce Sheet Resistance and to Improve Via Contact Resistance
摘要 A method of manufacturing a semiconductor device contact including forming an insulating layer over a substrate and forming an agglutinating layer over the insulating layer. The agglutinating layer is then exposed to a plasma treatment. A barrier layer is formed over the plasma-treated agglutinating layer, and a conductive layer is formed over the barrier layer.
申请公布号 US2007010080(A1) 申请公布日期 2007.01.11
申请号 US20060419542 申请日期 2006.05.22
申请人 发明人 TSAI JIAN-SHIN;CHOU YU-HUA;LUO TZO-HUNG;TSENG CHI-CHAN;ZHANG WEI;YANG JONG-CHEN
分类号 H01L21/3205;H01L21/44;H01L21/768 主分类号 H01L21/3205
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