发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having excellent heat resistance, and a method for manufacturing the semiconductor device. SOLUTION: The first invented semiconductor device includes a first conductive semiconductor layer; a first gate insulating film formed on the first conductive semiconductor layer; a first gate electrode formed on the first gate insulating film and having crystal grains of a first metal comprising Ru and a second metal selected from a group comprising W, Ni, Mo, Rh, Pd, Re, Ir, and Pt segregated from the crystal grains of the first metal; and first source-drain areas formed on the first conductive semiconductor layer through the first gate insulating film in a gate lengthwise direction. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007005721(A) 申请公布日期 2007.01.11
申请号 JP20050187037 申请日期 2005.06.27
申请人 TOSHIBA CORP 发明人 SAKUMA KIWAMU;TSUCHIYA YOSHINORI;KOYAMA MASATO
分类号 H01L29/78;H01L21/28;H01L21/8234;H01L21/8238;H01L27/088;H01L27/092;H01L29/423;H01L29/49;H01L29/786 主分类号 H01L29/78
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