发明名称 FLAW INSPECTION DEVICE OF IMAGE, VISUAL EXAMINATION DEVICE AND FLAW INSPECTION METHOD OF IMAGE
摘要 <P>PROBLEM TO BE SOLVED: To provide a flaw inspection device of an image capable of discriminating between true flaw, which shows an existing flaw, and a false flaw formed by background noise in a case that a pattern to be inspected exceeds the resolving limit of an imaging device and the contrast of an inspection image lowers, a visual examination device and a flaw inspection method of the image. <P>SOLUTION: It is discriminated that the flaw detected from the gray level difference signal of two images to be inspected is either one of the true flaw and the false flaw, corresponding to the S/N ratio of the gray level value signal of the original image to be inspected used in detection. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007003459(A) 申请公布日期 2007.01.11
申请号 JP20050186414 申请日期 2005.06.27
申请人 TOKYO SEIMITSU CO LTD 发明人 KATSUKI YUZO
分类号 G01N21/956;G01B11/30;G06T1/00;H01L21/66 主分类号 G01N21/956
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