| 摘要 |
<p>An improved test socket for use in testing integrated circuits. The test socket includes a housing (32) having one or more slots formed therein. Contacts (24) can be received within respective slots and maintained therein with rear ends (30) of the contacts in engagement with traces (14) on a load board. Mounting is accomplished by means of a pair of elastomers (46,48), and the elastomers maintain each contact such that, when the front end of a contact is engaged by the lead or pad of the device to be tested and urged into its corresponding slot, an arcuate surface (28) at a rear end of each contact rolls across its corresponding trace with virtually no translational or rotational sliding.</p> |
