发明名称 Low threshold voltage PMOS apparatus and method of fabricating the same
摘要 A P-type metal oxide semiconductor (PMOS) device can include an N-well that does not extend completely throughout the active region of the PMOS device. For example, the PMOS device can be fabricated using a masking step to provide an N-well having an inner perimeter and an outer perimeter. The inner perimeter of the N-well surrounds at least a portion of the active region of the PMOS device. According to an embodiment, the inner perimeter of the N-well surrounds the entire active region. The PMOS device can include a deep N-well in contact with the N-well.
申请公布号 US7161213(B2) 申请公布日期 2007.01.09
申请号 US20040911720 申请日期 2004.08.05
申请人 BROADCOM CORPORATION 发明人 ITO AKIRA;CHEN HENRY K.
分类号 H01L27/01;H01L21/338 主分类号 H01L27/01
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