发明名称 SEMICONDUCTOR MEMORY DEVICE HAVING IMPROVED COLUMN SELECTION LINE AND ITS' DRIVING METHOD
摘要 A semiconductor memory device with improved a column selection line and a driving method thereof are provided to prevent the degradation of high speed operation performance, by comprising a hierarchical column selection line by improving the column selection line. In a semiconductor memory device comprising at least one memory cell array and inputting/outputting data synchronously with a reference clock, a first global column selection line(GCSL1) and a second global column selection line(GCSL2) have a first frequency lower than the frequency of the reference clock and transfer a first global column selection signal and a second global column selection signal having a constant phase difference, in order to select a column of the memory cell array. A column selection gate pair(151,152,153,154) is connected between a bit line pair and an input/output line pair, and is connected to a local column selection line(LCSL). A logic operation part(171) performs logic operation of the first global column selection signal and the second global column selection signal, and outputs a local column selection signal having a second frequency higher than the first frequency. The local column selection signal is applied to the gates of the column selection gate pair through the local column selection line.
申请公布号 KR20070003477(A) 申请公布日期 2007.01.05
申请号 KR20050059480 申请日期 2005.07.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, SEUNG HOON
分类号 G11C11/4097 主分类号 G11C11/4097
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