| 摘要 |
A method for testing liquid crystal display devices is provided to mount a plurality of probe test lines instead of needle frames for detecting line defects, point defects, and pollution of a screen. In a method for testing liquid crystal display devices, a plurality of gate and data probe test lines(120,124) are formed perpendicularly to transparent electrodes(126), which connect gate and data pads(GP,DP) to first to fourth shorting bars, and carry out automatic probe testing. The gate and data probe test lines are connected to the gate and data pads by the transparent electrodes, and applied with signals by probe pads(122,128) for determining failure of an array substrate.
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