| 摘要 |
An exemplary hi-pot testing device ( 2 ) includes a testing table ( 20 ), a transfer table ( 21 ) movably supported on the testing table and configured to support a product ( 200 ) to be tested, and a hi-pot testing signal generator ( 27 ) under the testing table. The transfer table includes a top surface and a bottom surface, a first current input portion ( 23 ) at the bottom surface ( 202 ), a first power connector ( 234 ) embedded at the top surface, and electrically connecting to the first current input portion, and a first signal cable connector ( 25 ) arranged on the top surface. The first signal cable connector is grounded and configured to enable the product to be grounded. The hi-pot testing signal generator is configured to electrically connect with and electrically disconnect from the first current input portion of the transfer table.
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