发明名称 Process for electroless copper deposition
摘要 Embodiments of the invention provide methods for forming conductive materials within contact features on a substrate by depositing a seed layer within a feature and subsequently filling the feature with a copper-containing material during an electroless deposition process. In one example, a copper electroless deposition solution contains levelers to form convexed or concaved copper surfaces. In another example, a seed layer is selectively deposited on the bottom surface of the aperture while leaving the sidewalls substantially free of the seed material during a collimated PVD process. In another example, the seed layer is conformably deposited by a PVD process and subsequently, a portion of the seed layer and the underlayer are plasma etched to expose an underlying contact surface. In another example, a ruthenium seed layer is formed on an exposed contact surface by an ALD process utilizing the chemical precursor ruthenium tetroxide.
申请公布号 US2007004201(A1) 申请公布日期 2007.01.04
申请号 US20060385037 申请日期 2006.03.20
申请人 APPLIED MATERIALS, INC. 发明人 LUBOMIRSKY DMITRY;WEIDMAN TIMOTHY W.;SHANMUGASUNDRAM ARULKUMAR;KOVARSKY NICOLAY Y.;WIJEKOON KAPILA
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
主权项
地址