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发明名称
具有深开口之半导体装置的制造方法
摘要
提供一种具有深开口之半导体装置的制造方法,该方法包含:在一基板上形成一绝缘层;选择性地蚀刻该绝缘层以形成第一开口;扩大该第一开口的区域;在该已扩大之第一开口的侧壁上形成抗曲间隔物;以及蚀刻残留在该已扩大之第一开口下的该绝缘层部份并形成第二开口。
申请公布号
TW200701404
申请公布日期
2007.01.01
申请号
TW094147248
申请日期
2005.12.29
申请人
海力士半导体股份有限公司
发明人
赵瑢泰;李海朾;祥薰
分类号
H01L21/8242(2006.01)
主分类号
H01L21/8242(2006.01)
代理机构
代理人
何金涂;林荣琳
主权项
地址
韩国
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