发明名称 THE QUALITY EVALUATION METHOD OF CRYSTAL-GROWN INGOT
摘要 PROBLEM TO BE SOLVED: To provide a quality evaluation method of a crystal-grown ingot, which determines a cutting position and a sampling position of single-crystal ingot more reasonably and scientifically. SOLUTION: A quality evaluation method of a crystal-grown ingot includes a step of determining a cutting position and a sampling position, and a step of evaluating a sample, wherein the step of determining the cutting position and the sampling position includes (a) a step of inputting basic information for determining a cutting position, sampling position, and prime position for each equipment or product, (b) a step of predicting the cutting position, sampling position, and prime position according to the basic information, (c) a step of monitoring a growing process of an ingot, and analyzing and storing an X factor associated with growth of the ingot, and (d) a step of determining the cutting position and the sampling position reflecting the basic information and the X factor. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006352131(A) 申请公布日期 2006.12.28
申请号 JP20060165206 申请日期 2006.06.14
申请人 SILTRON INC 发明人 KIM JIN GEUN;CHO HYON-JONG
分类号 H01L21/66;C30B29/06 主分类号 H01L21/66
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