| 摘要 |
The present invention is generally directed to a system and method for testing component tolerances of a device (100) for testing integrated circuits. An electrical connection is established between electrical conductors (506) of a first and second test connector such that a first driver (402a) from a first circuit board (400a) is electrically connected across a low impedance path to a first receiver (404b) or PMU (406b) on a second circuit (400b). Then the output of the first driver (402a) is controlled to drive an electrical signal to a predetermined value, and evaluates the signal level received at the PMU (406b) on the second circuit board (400b). Finally, the output of the first driver (402a) is controlled to drive an electrical signal to a predetermined value across a low impedance path to the first receiver (404b) and verifies that, considering predetermined error of the first driver, the voltage level interpreted by the first receiver (404b) is within published ATE specifications. If so, then the system recognizes the tested components as being within specified tolerances. If not, the system flags the error and may take further appropriate, corrective action. Such corrective action may comprise initiating further testing or notifying (via e-mail or otherwise) relevant test personnel to conduct further manual testing. <IMAGE> |
