发明名称 MULTILAYERD SUBSTRATE OBTAINED VIA WAFER BONDING FOR POWER APPLICATIONS
摘要 <p>A multi-layer semiconductor device utilizes the good thermal and electrical properties of a polycrystalline substrate with the electrical properties of single crystal film transferred via wafer bonding. The device structure includes a polycrystalline, e.g., silicon carbide substrate, which was polished. A planarization layer of silicon is formed on the surface, followed by chemical mechanical polishing. The substrate is then bonded to either a bulk silicon wafer or a silicon-on-insulator (SOI) wafer. The silicon (SOI) wafer is thinned to the desired thickness.</p>
申请公布号 WO2006138422(A1) 申请公布日期 2006.12.28
申请号 WO2006US23244 申请日期 2006.06.14
申请人 NORTHROP GRUMMAN CORPORATION;AUGUSTINE, GODFREY;HARTMAN, JEFFREY, D.;ELVEY, ERICA, C.;TITTEL, PAUL, A. 发明人 AUGUSTINE, GODFREY;HARTMAN, JEFFREY, D.;ELVEY, ERICA, C.;TITTEL, PAUL, A.
分类号 H01L21/20 主分类号 H01L21/20
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