发明名称 SEMICONDUCTOR DEVICE
摘要 A semiconductor device is provided to prevent leak current from being generated by forming an end of a gate electrode on an insulation layer ticker than a gate insulation layer. A semiconductor device includes a semiconductor layer(10), a transistor formed on the semiconductor layer and having a gate insulation layer(104) and gate electrodes(106,126), an interlayer dielectric(40) formed on the transistor, and an electrode pad(42) formed on the interlayer dielectric and superposed on a portion of the gate electrode. The transistor has an insulation layer formed under ends of the gate electrodes to have a thickness thicker than the gate insulation layer.
申请公布号 KR20060134865(A) 申请公布日期 2006.12.28
申请号 KR20060056838 申请日期 2006.06.23
申请人 SEIKO EPSON CORPORATION 发明人 SHINDO AKINORI;TAGAKI MASATOSHI;KURITA HIDEAKI
分类号 H01L21/28;H01L21/3205;H01L21/60 主分类号 H01L21/28
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