发明名称 EEPROM DEVICE HAVING SINGLE GATE STRUCTURE, OPERATION METHOD OF THE EEPROM AND FABRICATION METHOD OF THE EEPROM
摘要 <p>An EEPROM with a single gate structure, an operating method thereof and a method for manufacturing the same are provided to prevent the degradation of a read transistor by using read and erase active regions separated from each other. A first and third active regions separated from each other are defined on a semiconductor substrate(10). A common floating gate crosses over the active regions. Source/drain regions(13s,13d) are formed at both sides of the common floating gate within the third active region. A first metal line(51) is connected to the first active region. A second metal line(55) is connected to a second active region. A third metal line is connected to one out of the source/drain regions.</p>
申请公布号 KR100660901(B1) 申请公布日期 2006.12.18
申请号 KR20050127770 申请日期 2005.12.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, GEUN SOOK;YI, SANG BAE;LEE, SOO CHEOL;HWANG, HO IK;LEE, TAE JUNG
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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