发明名称 |
EEPROM DEVICE HAVING SINGLE GATE STRUCTURE, OPERATION METHOD OF THE EEPROM AND FABRICATION METHOD OF THE EEPROM |
摘要 |
<p>An EEPROM with a single gate structure, an operating method thereof and a method for manufacturing the same are provided to prevent the degradation of a read transistor by using read and erase active regions separated from each other. A first and third active regions separated from each other are defined on a semiconductor substrate(10). A common floating gate crosses over the active regions. Source/drain regions(13s,13d) are formed at both sides of the common floating gate within the third active region. A first metal line(51) is connected to the first active region. A second metal line(55) is connected to a second active region. A third metal line is connected to one out of the source/drain regions.</p> |
申请公布号 |
KR100660901(B1) |
申请公布日期 |
2006.12.18 |
申请号 |
KR20050127770 |
申请日期 |
2005.12.22 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, GEUN SOOK;YI, SANG BAE;LEE, SOO CHEOL;HWANG, HO IK;LEE, TAE JUNG |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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