发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To control a source voltage level of a driver transistor for the unit of a memory cell column in a static semiconductor memory device. <P>SOLUTION: In a memory cell (MC), driver transistor source contacts (DV1, DV2) are short-circuited by internal metal wiring (9b). The metal wiring (9b) is separated from a memory cell of an adjacent column, and extends in a zigzag shape in the direction of memory cell columns. A line for transmitting a driver transistor source voltage can be individually disposed for each column and even in a single port memory cell structure, the driver transistor source voltage can be regulated for the unit of a memory cell column. <P>COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2006339480(A) 申请公布日期 2006.12.14
申请号 JP20050163641 申请日期 2005.06.03
申请人 RENESAS TECHNOLOGY CORP 发明人 ARAI KOJI
分类号 H01L27/11;H01L21/8244 主分类号 H01L27/11
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