| 摘要 |
PROBLEM TO BE SOLVED: To provide a circuit inspection item output system or the like capable of reducing a term necessary for a design of a semiconductor circuit, and improving quality of the semiconductor circuit even when a designer not thoroughly knowing an inspection item takes charge. SOLUTION: A PC 2a receives circuit information showing the semiconductor circuit by an input part 25, and transmits it to a server 1. The server 1 extracts inspection item information about the inspection item of the semiconductor circuit corresponding to the circuit information received from the PC 2a, from a circuit information DB 13a wherein the circuit information and the inspection item information are associated, and transmits it to the PC 2a. The PC 2a outputs the inspection item information received from the server 1 onto a display part 26. The PC 2a receives inspection execution information showing completion of inspection about the inspection shown by the inspection item information, and transmits it to the server 1, and the server 1 associates the inspection execution information received from the PC 2a with the inspection item information and the circuit information, and stores it in a storage part 13. COPYRIGHT: (C)2007,JPO&INPIT
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