首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
Verfahren und Apparat für verbesserte Inspektionsmessungen
摘要
申请公布号
DE69933726(D1)
申请公布日期
2006.12.07
申请号
DE19996033726
申请日期
1999.03.31
申请人
INFINEON TECHNOLOGIES AG;INTERNATIONAL BUSINESS MACHINES CORP.
发明人
GOULD, CHRISTOPHER J.;WHEELER, DONALD C.
分类号
G01B11/24;G01N21/88;G01B21/20;G01D3/028;G03F7/20
主分类号
G01B11/24
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Method and system for fast three-dimensional imaging using defocusing and feature recognition
Spectrometric process monitoring
Methods for real-time contamination, environmental, or physical monitoring of a photomask
Optical system for microlithography
Optical element supporting device, exposure apparatus using same, and device manufacturing method
Polymer dispersed liquid crystal display with lateral light source on side of black matrix and method of fabricating the same
Liquid crystal device and projector
Cholesteric liquid crystal display devices and methods of manufacturing the same
Integrated live video production system
Imaging lens, imaging device, and mobile terminal
Solid-state imaging device, signal processing device and signal processing method for solid-state imaging device, and imaging apparatus
Methods of manufacturing an organic electroluminescent device
Device for coupling a wireless headset to an eyeglass frame
Method for classifying a ground material-fluid mixture and mill classifier
Method for diagnosing the functional reliability of a lambda probe
Method and apparatus for preserving battery operation and life during vehicle post idle shutdown control
System and method for managing electric vehicle travel
Identifying impact of database changes on an application
Demand based power control in a graphics processing unit
Egomotion speed estimation on a mobile device using a single imager
